Fringe pattern analysis : 8-9 August 1989, San Diego, California / Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University
| データ種別 | 図書 |
|---|---|
| 出版者 | Bellingham, Wash., USA : SPIE |
| 出版年 | c1989 |
| 本文言語 | 英語 |
| 大きさ | vi, 260 p. : ill. ; 28 cm |
所蔵情報を非表示
| 配架場所 | 巻 次 | 請求記号 | 登録番号 | 状 態 | ISBN | 資料種別 | 利用注記 | 請求メモ | 予約 |
|---|---|---|---|---|---|---|---|---|---|
| 1F書庫3-洋書 |
|
549.95/R 25 | 080004211 | 0819401994 | 図書 |
|
|
|
書誌詳細を非表示
| 一般注記 | "Papers presented at the First SPIE Conference on Fringe Pattern Analysis"--Introd Includes bibliographical references and index |
|---|---|
| 著者標目 | Reid, Graeme T. (1st : 1989 : San Diego, Calif.) Society of Photo-optical Instrumentation Engineers SPIE Conference on Fringe Pattern Analysis |
| 件 名 | LCSH:Diffraction patterns -- Congresses LCSH:Interferometry -- Congresses LCSH:Image processing -- Congresses |
| 分 類 | LCC:QC415 DC20:621.36 |
| 書誌ID | 1000044517 |
| ISBN | 0819401994 |
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