OPTICAL CHARACTERIZATION OF EPITAXIAL SEMICONDUCTOR LAYERS
Material Type | Books |
---|---|
Publisher | Berlin ; New York : Springer-Verlag |
Year | 1996 |
Language | English |
Size | xiv, 429 p. ; 24 cm |
Location | Volume | Call No. | Barcode No. | Status | ISBN | Media type | Restriction | Request Memo | Reserve |
---|---|---|---|---|---|---|---|---|---|
1F書庫3-洋書 |
|
549.9/B 28 | 010042747 | 354059129X | 図書 |
|
Notes | Includes bibliographical references and index |
---|---|
Authors | Bauer, G. (Gnther), 1942- Richter, Wolfgang, 1940- |
Subjects | LCSH:Semiconductors -- Optical properties LCSH:Heterostructures LCSH:Epitaxy LCSH:Crystal growth |
Classification | LCC:IN PROCESS DC20:537.6/22/0287 |
ID | 1000072259 |
ISBN | 354059129X |
Library Service