OPTICAL CHARACTERIZATION OF EPITAXIAL SEMICONDUCTOR LAYERS
Optical characterization of epitaxial semiconductor layers / Gnther Bauer, Wolfgang Richter, editors
| Material Type | Books |
|---|---|
| Publisher | Berlin ; New York : Springer-Verlag |
| Year | 1996 |
| Language | English |
| Size | xiv, 429 p. ; 24 cm |
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| Location | Volume | Call No. | Barcode No. | Status | ISBN | Media type | Restriction | Request Memo | Reserve |
|---|---|---|---|---|---|---|---|---|---|
| 1F書庫3-洋書 |
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549.9/B 28 | 010042747 | 354059129X | 図書 |
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| Notes | Includes bibliographical references and index |
|---|---|
| Authors | Bauer, G. (Gnther), 1942- Richter, Wolfgang, 1940- |
| Subjects | LCSH:Semiconductors -- Optical properties LCSH:Heterostructures LCSH:Epitaxy LCSH:Crystal growth |
| Classification | LCC:IN PROCESS DC20:537.6/22/0287 |
| ID | 1000072259 |
| ISBN | 354059129X |
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